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    • 专利摘要:
    The invention relates to a system (10) for analyzing a microwave signal (HF) by imaging comprising: a solid material (M) at least one optical property of which can be modified in at least one zone (Zo) of said material, when said zone is simultaneously in the presence of an optical (Eo) or electrical (Ee) excitation and of a microwave signal having at least one frequency coinciding with a resonance frequency (fR) of the material, said material being further adapted to that a value of said resonance frequency (fR (B)) varies as a function of the amplitude of a magnetic field, -a magnetic field generator (GB) configured to generate a magnetic field (B) having, part of said zone, a spatial amplitude variation (B (x)) in a direction X, said material then having a resonance frequency (fR (x)) which is a function of a position (x) according to said direction X, and a detector (D) configured in to receive an image (Im) of said zone (Zo) in said direction X,
    公开号:FR3027681A1
    申请号:FR1402429
    申请日:2014-10-28
    公开日:2016-04-29
    发明作者:Mayeul Chipaux；Loic Toraille；Thierry Debuisschert；Christian Larat；Loic Morvan；Jan Meijer；Sebastien Pezzagna
    申请人:Universitaet Leipzig；Thales SA；
    IPC主号:
    专利说明:

    [0001] FIELD OF THE INVENTION The present invention relates to the field of the analysis of a microwave signal, whose frequency is typically between a few hundred MHz and a few tens of GHz. More particularly, the invention applies to the spectral analysis of the microwave signal.
    [0002] STATE OF THE ART The spectral analysis of microwave signals consists of identifying the frequency components of an unknown signal, and possibly their respective amplitudes.
    [0003] Commercial spectrum analyzers for signal characterization work as follows: the input signal is demodulated by mixing it with the signal of a local oscillator. After low-pass filtering, we obtain the components present in a narrow band around the frequency of the local oscillator. It is then necessary to scan the frequency of the local oscillator to obtain all the information on the input signal over a large spectral window. This solution has the main disadvantage of being intrinsically slow because of the sweep performed. In addition, it requires complex electronics and is therefore expensive and bulky.
    [0004] Finally, in the case of signals evolving over time, the state of the art does not make it possible to control the entire spectral window simultaneously (except to use an analyzer for each band). The probability of signal interception is at best a few percent. For applications requiring a probability of interception as close as possible to 100%, an alternative solution is to digitize directly on the largest possible bandwidth the input signal, then perform Fourier transforms on the samples obtained. This solution has two limitations: - The current performance of analog-to-digital converters limits the input bandwidth to less than 10 GHz, while presenting very insufficient dynamics with regard to the needs (mainly because of the sampling jitter and nonlinearities of conversion), - The data rate to be transmitted and processed is considerable (several hundred Gb / s and several Tflops), resulting in a volume, a consumption and a prohibitive price. While the performance of calculation and management of large data rates 10 progress very quickly (Moore's law), it is not the same for those very wideband analog-digital converters that stumble on fundamental limits of electronic components . An object of the present invention is to overcome the aforementioned drawbacks by proposing a system and a spectral analysis method making it possible to obtain an "image" of the complete spectrum of the input signal over a wide band, without scanning or digitization, or calculation. DESCRIPTION OF THE INVENTION According to a first aspect, the present invention relates to a system for analyzing a microwave signal by imaging comprising: a solid material whose at least one optical property is modifiable in at least one zone of the material, when the zone is simultaneously in the presence of an optical or electrical excitation and a microwave signal having at least one frequency coinciding with a resonant frequency of the material, said material being further adapted so that a value of said frequency The resonance frequency varies as a function of the magnitude of a magnetic field, a magnetic field generator configured to generate a magnetic field having, within a portion of said area, a spatial amplitude variation according to a X direction, said material then having a resonance frequency (fR (x)) function of a position in said X direction, and a configurable detector to receive an image of the area in the X direction, the image having at least one intensity variation resulting from the modification of the optical property, a position of which in the spectral image is a function of a corresponding frequency value the microwave signal to be analyzed illuminating the zone of the material, when the zone is simultaneously in the presence of an optical or electrical excitation and said magnetic field. Advantageously, the material is of planar geometry, the X direction being substantially contained in a plane of the material. Advantageously, the material is a crystal comprising colored centers. According to one embodiment, the crystal is a diamond substrate comprising NV centers in the crystalline mesh of the substrate, each NV center consisting of a nitrogen atom substituted for a carbon atom and coupled to a gap, the pair nitrogen atom / gap constituting a colored center in the crystalline mesh. According to one variant, the optical property is an absorption of an optical probe beam passing through said zone, the modification consisting in a variation of said absorption of the optical probe beam by the zone of the material. According to another variant, the optical property is a luminescence, the modification consisting of a variation of a luminescence intensity of said zone, the system further comprising an optical system configured to image said zone on said detector. Advantageously, the NV centers of the diamond substrate have a preferred direction among the four possible directions. Advantageously, the preferred direction of the NV centers is located in a plane of the material. Advantageously, the preferred direction of the centers NV corresponds to the direction X. Advantageously, the magnetic field generator is configured so that the spatial amplitude variation of the magnetic field is monotonic along X in said part of the zone.
    [0005] Advantageously, the magnetic field generator is configured so that the direction of the magnetic field is substantially aligned with a direction of the NV centers. Advantageously, the magnetic field generator is configured so that the direction of the magnetic field is included in a plane of the material. Advantageously, the magnetic field generator is configured so that the direction of the magnetic field is parallel to the direction X. Advantageously, the magnetic field generator is configured so that the amplitude of the magnetic field is substantially constant in a direction Z perpendicular to a plane of the material. According to one embodiment, the system according to the invention further comprises an emitter antenna disposed near the material and connected to a coaxial cable in which the microwave signal to be analyzed flows. In a variant, the system according to the invention furthermore comprises a processing device configured to acquire a plurality of images at successive instants and to generate a two-dimensional synthetic image by juxtaposing the acquired spectral images, so as to visually make an evolution the spectrum of the microwave signal to be analyzed as a function of time. According to another aspect, the invention relates to a method for analyzing a microwave signal by imaging comprising the steps of: - optically or electrically exciting an area of a solid material of which at least one optical property is modifiable in said zone when said zone is simultaneously in the presence of said excitation and of a microwave signal having at least one frequency coinciding with a resonant frequency of the material, the material being further adapted so that a value of the resonant frequency varies according to the amplitude of a magnetic field, - generating a magnetic field having, within a part of said zone, a spatial amplitude variation, said material then having a resonance frequency depending on a position in said direction X, receiving on a detector an image of said zone in said direction X, the image having at least one variation intensity of which a position in said image is a function of a corresponding frequency value of said microwave signal to be analyzed illuminating said material, when said portion of the zone of the material is simultaneously excited optically or electrically and subjected to said magnetic field. According to one embodiment, the method according to the invention further comprises the steps of acquiring a plurality of images at successive instants and generating a two-dimensional synthetic image by juxtaposing the acquired images, so as to visually make an evolution of the image. spectrum of the microwave signal to be analyzed as a function of time. Advantageously, the method according to the invention further comprises a calibration step of generating a synthetic image from a single-frequency microwave signal whose frequency varies over time according to a known law, so as to obtain a correspondence between position in the image and resonance frequency. Other characteristics, objects and advantages of the present invention will appear on reading the detailed description which follows and with reference to the appended drawings given by way of non-limiting examples and in which: FIG. Spectral analysis according to the invention, FIG. 2 illustrates the fundamental and excited levels of the NV center in a crystalline matrix, FIG. 3 illustrates the energy diagram of the NV center. FIG. 4 illustrates the displacement of the levels by effect. Zeeman in the presence of a magnetic field, FIG. 5 illustrates the axis of quantification of a center NV corresponding to the axis joining the nitrogen atom to the gap, FIG. 6 illustrates the optical detection of the resonances. As a function of the resonance frequency f R, displaced in the presence of a non-zero magnetic field by the Zeeman effect, FIG. 7 illustrates a first option of the system according to the invention, according to which the Optical operation is the luminescence, FIG. 8 illustrates a second option of the system according to the invention, according to which the optical property is the absorption of a probe beam; FIG. 9 illustrates an example of luminescence variation as a function of of the frequency and the position x in the presence of a magnetic field B (x), FIG. 10 illustrates a bijective relation fR (x) obtained in a selected window, FIG. 11 illustrates the operation of the system for a case wherein the microwave signal to be analyzed comprises 3 frequencies fRi, fR2, fR3, -12 shows an optical configuration of a system according to the invention based on luminescence, -13 shows another optical configuration of a system According to the invention based on luminescence, FIG. 14 illustrates an example of generation of a variable magnetic field B (x), FIG. 15 illustrates a system according to the invention comprising a transmitting antenna arranged In the vicinity of the material, FIG. 16 schematizes an emitting antenna lithographed on the surface of the material, FIG. 17 illustrates a system according to the compact invention, FIG. 18 illustrates a microwave signal HF that varies over time at analyze, FIG. 19 schematizes a synthetic image obtained with a system according to the invention comprising a processing device. DETAILED DESCRIPTION OF THE INVENTION FIG. 1 depicts a system 10 for analyzing an RF microwave signal by imaging according to the invention. The system applies preferentially to microwave signals with a frequency of between a few hundred MHz and a few tens of GHz. The system 10 comprises a solid material M of which at least one optical property is modifiable in at least one zone Zo of the material, when this zone is simultaneously in the presence of an Eo or electrical excitation Ee and of a microwave signal HF having at least one frequency coinciding with a resonant frequency fR of the material. Examples of optical properties are given below.
    [0006] The solid material M is further adapted so that a value of the resonance frequency f R varies as a function of the amplitude of a magnetic field B. An example of a physical effect making it possible to obtain this effect is detailed below.
    [0007] The system further comprises a magnetic field generator GB configured to generate a magnetic field B having, within a portion of the zone Zo, a spatial amplitude variation B (x) along a direction X. Because of the dependence of the resonance frequency as a function of B, the material therefore has a resonance frequency fR (x) which is a function of a position x in the X direction. Thus, in the presence of a frequency microwave signal coinciding with a resonance frequency fRo of the material, an optical property of the material is changed to x0 along X, where x0 is the position corresponding to the frequency fRo. This variation of optical property results in a local variation of light energy in x0. In this way, the frequency information is spatially and optically encoded in the material M, and a direct relationship is obtained between the position x in the zone Zo of the material and the associated resonance frequency fR (x).
    [0008] Finally, the system 10 comprises a detector D configured to receive an image 1m of the zone Zo, and more particularly of the portion of the zone Zo having a controlled variation of the magnetic field B in the direction X. The coding of the spectral information is unidimensional, the detector D is one-dimensional, or two-dimensional.
    [0009] Thus, the image 1m exhibits at least one intensity variation 611 resulting from the modification of the optical property, whose position in the image 1m is a function of the corresponding frequency value of the microwave signal HF to be analyzed illuminating the zone Zo of the material, when this zone is simultaneously in the presence of an optical excitation Eo or electrical Ee and 30 of the magnetic field B. The system 10 thus directly provides a "projection" of the full spectrum of the RF signal to be analyzed over a wide band, without digitization neither calculation. The spectral information is spatially coded along the X direction of the solid material M. A corresponding spatial coding is found in the image lm along a direction XI.
    [0010] An advantage of the system 10 according to the invention is that it analyzes all the frequencies of the RF signal at the same time. The system 10 is therefore faster than a conventional scanning system. Moreover, because of its simplicity, it is less expensive and more compact.
    [0011] Alternatively, the image 1m once detected by D undergoes processing to improve the quality and readability of the spectral information. Preferably, the solid material M has a planar geometry, and the direction X is substantially contained in a plane of the material. This geometry allows imaging simpler to implement and corresponds to the geometry of a crystal-type material for obtaining the physical effects described above. Preferably, the material is a crystal comprising colored centers. In the following we will explain by way of example the operation of the system 10 with a material of this type. The crystal is, for example, an SiC substrate, or preferentially a diamond substrate comprising NV centers in the crystalline mesh of the substrate, each NV center being constituted by a nitrogen atom substituted for a carbon atom and coupled to a gap, the nitrogen atom / lacuna pair constituting a colored center in the crystalline mesh. An NV center is a point defect of the crystalline mesh, for example diamond, formed by a nitrogen atom (N) which is substituted for a carbon atom and which is coupled with a gap in an adjacent site of the mesh. crystalline (V for "vacancy"). Obtaining NV centers in diamond is well controlled. Large diamonds are produced by CVD (Chemical Vapor Deposition) process typically in the form of parallelepipeds of several mm side and several hundred μm thick. NV centers can be created by ion implantation of nitrogen atoms. They can also be created by incorporating nitrogen in a controlled manner during diamond growth by the "delta doping" method. At the end, the diamond is annealed (800 ° C) so that the vacancies and nitrogen impurities recombine to form the NV centers. NV centers are created in volume or in uniform layers near the surface.
    [0012] The nitrogen plus gap forming the center NV thus constitutes an "artificial atom" trapped within the diamond matrix and detectable optically at the individual scale by microscopy. An NV center has a specific location that does not change over time.
    [0013] The axis between the gap and the nitrogen atom constitutes the quantization axis uNv of the NV center (illustrated in FIG. 5). By the symmetry of the crystal, this axis can take four different orientations. The NV center has fundamental energy levels G and excited E as shown in Fig. 2. The excitation of the NV center is by optical pumping in the green (eg at 532 nm). NV centers emit red luminescence (centered around 637 nm for negatively charged NV center). The bold levels correspond to the isolated system of its environment. Taking into account the interaction between the center NV- and the surrounding crystal lattice results in the appearance of additional levels represented in fine lines (phonon enlargement). The system, initially in the ground state, is brought into an excited state by absorption of a pump photon. Non-radiative recombination brings it to the excited level of lower energy (fat) The return to the ground state is by radiative deexcitation which results in the emission of a luminescence in the red. There are several electronic configurations of the NV center. The preferred configuration for the implementation of the invention is the negatively charged NV- configuration. Subsequently we will use indifferently the NV- and NV notation to describe the NV center according to the invention. The NV- center is a two-electron system. The fundamental level 3A2 of the center NV- corresponds to a triplet level S = 1 of the electronic spin, its structure is illustrated in FIG. 3. There is a degeneracy lift between the level ms = 0 on the one hand and the levels ms. = -1 and ms = + 1 on the other hand, both in the fundamental level 3A2 (v0 = 2.88 GHz) and in the excited level 3E. Radiative transitions are possible between identical spin levels (ms). They are at the origin of the luminescence of NV - centers. A non-radiative de-excitation path between the excited levels ms = + 1 and ms = -1 and the ground level ms = 0 is possible through levels 1E and 1A1. Level 1A1 has a long life (metastable level). This transition allows optical pumping of the NV center with center polarization mainly in the fundamental ms = 0 level. This transition also explains the weakest luminescence of a center initially in the state ms = + 1 or m8 = -1 with respect to a center initially in the state ms = 0. A remarkable property of NV centers is therefore to be able to polarize the spin in its state ms = 0 by optical pumping, then to be able to optically detect the resonance of the transition ms = O-> ms = ± 1. A first optical property is the sensitivity of the luminescence to a microwave signal and the magnetic field, as explained below. When the center NV is subjected to a microwave radiation of frequency vo = 2.88 GHz resonating with the transition ms = 0 -> ms = ± 1, a decrease in the level of luminescence is observed, illustrated by the curve 60 of FIG. 6, which allows to detect the resonance ("Optically Detected Magnetic Resonance" (ODMR)). The Zeeman effect consists of a coupling between an external magnetic field and the magnetic moment of the electrons. It results in a degeneracy lift of the levels ms = +1 and ms = -1, which shows two resonances located on either side of the central frequency of 2.88 GHz separated by an interval Av as illustrated in FIG. 4 with: Av = h 25 g: Landing factor (very close to 2) h: Planck constant (6.62 e-34 m2 kg / s) pB: Bohr magneton (-9.274 e-24 J / T) BNv component the external magnetic field B projected on the quantization axis uNv of the center NV. The factor gi-B is 28 MHz / mT h The position of these two frequencies varies in proportion to the magnitude of the magnetic field. As previously described, a variation of the optical signal is thus observed when the frequency of the microwave signal HF coincides with these two resonances as illustrated by the curve 61 of FIG. 6. Thus, according to a first option illustrated in FIG. 7, the optical property of the material used is a luminescence L, which results in a light emission when the material is subjected to excitation. For a solid material M consisting of a diamond substrate comprising NV centers, the luminescence is preferably obtained by an optical excitation Eo, typically a light source, such as a pump laser, emitting in the visible, preferentially in the band [400 nm; 650 nm]. As a variant, the luminescence is obtained by electrical excitation Ee, ie by generating an electric current flowing in the material. This can be achieved by creating a P-N junction in the vicinity of the NV centers. When the frequency of the hyper HF signal coincides with a resonance frequency fR of the material, the luminescence intensity is modified, typically a decrease In of the intensity is observed. According to a variant the system further comprises an optical system S 20 configured to image the zone Zo on the detector D. According to another variant, the detector is arranged as close as possible to the emitting zone Zo. Thus, we maintain the correspondence between x0, where the modification of the optical property of the material occurs, and the corresponding xi position on D. According to a second option, the remarkable optical property is the sensitivity of the absorption of a beam probe Es crossing the zone Zo of the material M, to a microwave signal HF and to the magnetic field. The application to a system 10 according to the invention is illustrated in FIG. 8, and explained below for the example of the diamond comprising NV centers, given in a non-limiting manner. The diamond comprising NV centers, implanted in surface or in volume, absorbs a portion of the intensity of a probe beam of IR wavelength, typically 1042 nm. When the frequency of the microwave signal coincides with a resonance frequency fR of the diamond, 2.88 GHz in the absence of an external magnetic field, the system can pass from the ms = 0 level to the levels m = + II-1 of the triplet 3A2, then to the level m = + 1 / -1 of triplet 3E. From there, it can recombine in a non-radiative way towards the fundamental level ms = 0 passing through the metastable level. The long life of this level (600 ns) compared to other levels allows to accumulate a population on this level. By using a resonant probe beam with the transition 1A1 → 1E (1042 nm), it is then possible to obtain an absorption signal proportional to the population of level 1A1. If the frequency of the microwave signal is not resonant with the transition at 2.88 GHz, the process described above is no longer possible and the population of the level M is lower than in the previous case. As a result, the absorption of the probe beam is also lower. It is thus seen that a variation of the absorption signal of the probe beam 6A (fR) makes it possible to detect whether the microwave signal is resonant with the transition at 2.88 GHz. In the case where a magnetic field is applied, the degeneracy of the levels 3A2 ms = -1 and ms = + 1 is raised and two decreases of the absorption are observed as a function of the frequency, corresponding to the two resonances. The transmitted probe signal is similar to that described in FIG. 6. It is possible to use an extended probe beam so as to cover the entire useful area corresponding to the magnetic field gradient and then to be able to make an image of the probe beam. transmitted and thus measure the frequency of the microwave signal by measuring the position of the absorption increase. For optimum reception of the variations of the intensity of the probe beam Es, the detector D is preferably disposed near the material M, for example in direct contact with a surface of the material.
    [0014] We will now describe preferred embodiments of the luminescence based system 10, these embodiments also being applicable to a system based on probe beam absorption.
    [0015] In the standard CVD diamonds, the NV centers are oriented along 4 different quantization axes uNvi to UNv4 (corresponding to the 4 main directions of the crystallographic structure of the diamond), and we thus have 4 pairs of lines corresponding to the value of the projection of the magnetic field along each of these axes. When the diamond is placed in a magnetic field gradient B (x), the projection of B on the 4 axes varies, and therefore the position of the resonant frequencies varies. FIG. 9 illustrates an example of luminescence, as a function of the x position according to the gradient (the general result depends on the configuration of the gradient and the position of the diamond in it) and as a function of the frequency hyper fR in GHz. In this figure the position x in the gradient is given in abscissa, the frequency is in ordinate and the minima of luminescence appear in black. By scanning the frequency for example between 1.9 and 3.2 GHz, we observe a shift of the resonant frequencies as a function of the position x. However, we see that for a position x, there may be several frequencies leading to the resonance. There is a pair of hyperbolas associated with each quantization axis. FIG. 9 shows two couples associated with two quantization axes DRa (dashed) and DRb (solid lines).
    [0016] For the two quantization axes DRa and DRb, the curves giving the resonance as a function of the position x are similar but shifted. Thus the frequency v0 is obtained for two different positions, x1a and x1b respectively. As can be seen in Figure 9, for a given position x, several NV center directions may give rise to resonances for different frequency values. There is therefore an ambiguity between the measurement of the resonance at a given position x and the determination of the corresponding frequency fR (x). A first solution for overcoming this ambiguity is to place oneself, for example, in an area indicated by the frame 90: There then exists a bijective relation between the frequency and the position since at a frequency there corresponds only one resonance and therefore a single value of x. Another solution is to use crystals of crystallographic growth orientation [113] or [111]. In this case, it is possible to obtain crystals in which the centers NV- have a preferred direction DRp among the four possible ones, or else are all oriented in the same direction DRp. These diamonds are obtained by CVD growth in a particular crystallographic direction [111] or [113]. The material can then be doped during growth with nitrogen to produce NV centers, which then preferentially form in the direction of growth. This gives a unique orientation direction for the NV centers, and it is possible with these crystals to have an unambiguous correspondence between position and frequency over the entire spectrum.
    [0017] To simplify the interpretation of the images, and to limit the effects of contrast reduction, the preferred direction DRp is preferentially located in a plane of the material, which is obtained with a crystallographic direction [1111 Preferably this direction is substantially parallel to the X direction FIG. 10 illustrates the bijective fR (x) relation, for frequencies between 1.9 and 2.5 GHz, obtained in a selected window with a variation B (x) of the order of 10 mT over approximately 1 mm.
    [0018] The curve giving the dependence of B (x) with x is similar to that giving the dependence of fR (x) with x, since the Zeeman effect is essentially linear for these values. FIG. 11 illustrates the operation of the system 10 for a simple case in which the microwave signal to be analyzed comprises 3 frequencies fRi, fR2, fR3. Figure 11a describes the spectrum measured by a conventional spectrum analyzer. An optical system images the luminescence resulting from the zone Zo subjected to a variable magnetic field B (x). FIG. 11b illustrates the image 1m obtained, which spatially codes the 3 frequencies fRi, fR2, fR3 in three dark areas at abscissae X11, X12, X13 of an axis X1 connected to the X axis by the magnification of the optical system . FIG. 11c illustrates the luminescence intensity curve L (arbitrary unit) as a function of frequency, obtained from the image 1m having converted the abscissa into a corresponding frequency, using a calibration. Luminescence minima appear at the three frequencies fR2fR3 of the hyper HF signal illuminating the diamond. Figure 12 illustrates an example of a luminescence based system. The optical excitation Eo, a pump laser beam configured to emit in the visible, for example at 532 nm, illuminates the material by the wafer and in the direction X of variation of the field B. The optical system S consists of an Om microscope objective, a filter F and a focusing lens Lf. The detector D is included in a camera C having a conventional two-dimensional detector, of CCD or CMOS technology, for example. A 2D image of the fluorescence is thus obtained. An advantage of this optical configuration is that the direction of the pump laser coincides with the X direction, which makes it possible to effectively use a large area Zo, and with good uniformity of pumping. According to another variant illustrated in FIG. 13, the excitation optical signal Eo is sent from above via the microscope objective Om, using a dichroic plate LD. By way of illustration, experiments carried out by the inventors have been carried out according to a configuration illustrated in FIG. 12 with a power of the pump laser of 300 mW, and an acquisition time of an image lm of 4 ms. The laser power and acquisition time can be decreased by using a diamond having a much higher density of NV centers than the diamond used for this demonstration experiment. Figure 14 illustrates an example of generating a variable magnetic field B (x), conventionally used for trapping cold atoms. The generator GB comprises four magnets El, E2, E3, E4 arranged at 450 with respect to two perpendicular planes of symmetry Ps, Ps'. The intersection 30 between the two planes constitutes an area in which the magnetic field is zero. The material is arranged perpendicular to the planes of symmetry, the zone Zo being situated in the vicinity of an intersection with one of the planes of symmetry but not including the intersection between the two planes of symmetry. In this particular magnet configuration, the magnitude of the magnetic field is a monotonically increasing function of the abscissa along a plane of symmetry on at least one region. Thus, the plane of symmetry along which the material is positioned corresponds to the X direction. A monotonic variation of the magnetic field makes it possible to obtain a wide range of resonance frequencies.
    [0019] Preferably, the direction of the magnetic field is substantially aligned (within + -200) with a quantization direction of the NV centers. This makes it possible to maximize the projection of the magnetic field with respect to the preferred direction of the NV- centers, to preserve the linearity of the Zeeman effect over a wider frequency range and to avoid the effects of lowering of contrast when the transverse component the field (perpendicular to the quantization axis) becomes too large. In addition, the interpretation of the data is simplified and the exploitable frequency deviation is maximized.
    [0020] Indeed, the effect of low contrast originates from a misalignment between the axis of the center NV and the direction of the magnetic field. When the magnetic field becomes too large, it is he who imposes the quantization axis, and no longer the orientation of the center NV. If the magnetic field has a large transverse component, the eigenstates of the system are no longer the spin states ms = -1, ms = 0, ms = + 1, but linear combinations of these. Consequently, the difference in luminescence as a function of the initial state is less pronounced and at the limit completely disappears when the field is very intense. This is the effect of contrast decline. In a configuration where the field is aligned with a quantization direction of the NV centers, a broad spectral sweep range, typically of several tens of GHz, is achieved without losing the luminescence properties of the NV centers. In addition to the aforementioned advantage, the alignment of the magnetic field with one of the NV center directions has an additional advantage when the four possible orientations of centers are present in the diamond. Aligning the magnetic field with one of the orientation directions of the NV centers makes it possible to select it when the magnetic field becomes sufficiently intense. The other three possible directions, not aligned with the magnetic field, see the contrast of the resonances decrease and the corresponding signal disappear. There remains only one pair of resonances, which has an effect similar to what would be obtained with a crystal where NV centers have a single preferred direction.
    [0021] When the preferred direction DRp exists, advantageously the magnetic field is aligned with this direction. When the quantization axis of the NV centers "is not included in a plane of the substrate, one option is to tilt the magnets with respect to the diamond, By aligning the field well, a range of analysis up to 30 GHz is obtained when the magnets used produce a 1T field in contact (the upper limit is determined by the magnitude of the magnetic field) A bandwidth of 30 GHz divided by a resolution of 5 MHz corresponds to about 6000 channels of 'analysis.
    [0022] Preferably, the magnetic field generator GB is configured so that the direction of the magnetic field is included in a plane of the material. Preferably, the magnetic field generator GB is configured so that the direction of the magnetic field is parallel to the X direction, which is the case of the configuration of FIG. 14. This simplifies the overall geometry of the system and makes it possible to maximize the range. of frequency analyzed. Thus an advantageous configuration is to align along the X direction (located in a plane of the material), the direction of the magnetic field, the preferred direction of NV centers and the direction of the pump laser. Advantageously, the magnetic field generator GB is configured so that the amplitude of the magnetic field is substantially constant in a direction Z perpendicular to an XY plane of the material. This characteristic is obtained with the configuration of FIG. 14 for long magnets in the Z direction, which imposes the invariance of the field along Z. This allows all the NV centers located along an axis Z and having the same coordinates (x, y) to have the same resonance frequency. It is therefore possible to sum all their contributions to form the signal corresponding to the same pixel of the field of the camera comprising the detector. Advantageously, for a beam width of the small pump laser in front of the distance to the magnets, there is an invariance of the Y-field. We therefore have an invariance of the position of the resonance according to Y, which makes it possible to sum all the contributions of each y for a given x, and so improve the sensitivity. To send the RF signal to be analyzed on the system according to the invention with better efficiency, the system 10 advantageously comprises an emitting antenna EA disposed near the material M and connected to a coaxial cable C in which the microwave signal HF to be analyzed flows. As illustrated in FIG. 15. Advantageously, the cable C is connected to a receiving antenna RA to better capture the RF signal. The transmitting antenna EA comprises for example a loop for having a uniform field at the crystal. The system 10 of the previous demonstration experiment has a sensitivity for detecting signals of a power at least as low as -10dBm for an acquisition time of 20s (power measured by the generator at the entrance of the cable coaxial to the transmitting antenna). This sensitivity is improved by the use of a more suitable antenna to more efficiently focus the microwave field on the useful area, such as a rectangular antenna rather than circular. To realize a compact system, the transmitting antenna is lithographed on the surface of the material, as illustrated in FIGS. 16 and 17. FIG. 17 illustrates a system 10 with optimized compactness. The pump laser is a DL laser diode in direct contact with the diamond, a CCD sensor is directly bonded to the diamond and the EA antenna is lithographed on its surface on the opposite side to the CCD detector. According to a variant, and in order to give an overall view of the spectrum to be analyzed and its evolution over time, the system 10 according to the invention further comprises a processing device configured to acquire a plurality of images Im1, Im2 , respectively, at successive instants t1, t2 ..., tn and for generating a two-dimensional synthetic image Is by juxtaposing the acquired spectral images Im1, 1m2, so as to visually make an evolution of the spectrum of the microwave signal HF to analyze as a function of time. A synthetic image is illustrated in FIG. 19 for an RF signal to be analyzed illustrated in FIG. 18, a dual frequency, the two frequencies being separated by a frequency interval Af varying over a period T between a value Af1 and a value Afn. Synthetic is commonly called spectrogram, and gives a specialist an instantaneous view of the evolution of the spectrum over time. According to another aspect, the invention relates to a method for analyzing an RF microwave signal by imaging comprising the steps of: optically or electrically exciting a zone Zo of a solid material M whose at least one optical property is modifiable in said zone when said zone is simultaneously in the presence of said excitation and of a microwave signal having at least one frequency coinciding with a resonance frequency fR of the material, the material being further adapted so that a value of the frequency of resonance fR (B) varies as a function of the amplitude of a magnetic field, - generating a magnetic field B having, within a portion of said zone, a spatial amplitude variation B (x), the material then having a resonance frequency fR (x) as a function of a position x in the direction X, - receiving on a detector D an image lm of the area Zo in the direction X, the image lm near at least one variation of intensity ^ 51, a position in the image is a function of a corresponding frequency value of the microwave signal HF to be analyzed illuminating the material M, when the part of the zone of the material is simultaneously excited optically or electrically and subject to magnetic field B.
    [0023] Advantageously, the method further comprises the steps of acquiring a plurality of images Im1, Im2, Imn at successive times t1, t2 ..., tn and generating a two-dimensional synthetic image Is by juxtaposing the images acquired, so as to visually to make an evolution of the spectrum of the microwave signal HF to be analyzed as a function of time. Advantageously, the method further comprises a calibration step of generating a synthetic image from a single-frequency microwave signal whose frequency varies over time according to a known law, so as to obtain a correspondence between position in the image and resonance frequency. For example, it is possible to use a calibration signal corresponding to a known monochromatic signal whose frequency is varied. The resonance frequency is then determined for each value of x, thereby obtaining the frequency / position correspondence.
    权利要求:
    Claims (19)
    [0001]
    REVENDICATIONS1. System (10) for analyzing a microwave signal (HF) by imaging comprising: a solid material (M) whose at least one optical property is modifiable in at least one zone (Zo) of said material, when said zone is simultaneously in the presence of an optical (Eo) or electrical (Ee) excitation and of a microwave signal having at least one frequency coinciding with a resonant frequency (fR) of the material, said material being further adapted so that a value of said resonant frequency (fR (B)) varies as a function of the magnitude of a magnetic field, -a magnetic field generator (GB) configured to generate a magnetic field (B) having, within a part of said zone, a spatial amplitude variation (B (x)) in a direction X, said material then having a resonance frequency (fR (x)) which is a function of a position 15 (X) in said direction X , and a detector (D) configured to receive an im age (lm) of said zone (Zo) in said direction X, said image having at least one intensity variation (a1) resulting from the modification of the optical property, a position of which in the spectral image is a function of a corresponding frequency value of said microwave signal (HF) to be analyzed illuminating said zone of the material, when said zone is simultaneously in the presence of an optical (Eo) or electrical (Ee) excitation and of said magnetic field (B). 25
    [0002]
    2. System according to claim 1 wherein the material is of planar geometry, the X direction being substantially contained in a plane of the material.
    [0003]
    3. System according to one of claims 1 or 2 wherein the material is a crystal comprising colored centers.
    [0004]
    The system of claim 3 wherein the crystal is a diamond substrate comprising NV centers in the crystal lattice of said substrate, each NV center consisting of a nitrogen atom substituted for a carbon atom and coupled to a gap, the nitrogen atom / gap pair constituting a colored center in said crystalline mesh.
    [0005]
    5. System according to one of the preceding claims wherein said optical property is an absorption of a probe optical beam (Es) passing through said zone (Zo), said modification consisting in a variation of said absorption (CA [Fs]) of said optical beam probe (Fs) through said area of the material.
    [0006]
    6. System according to one of the preceding claims wherein said optical property is a luminescence, said modification consisting of a variation of a luminescence intensity (CL) of said area, said system further comprising an optical system (S) configured for imaging said zone (Zo) on said detector (D).
    [0007]
    7. System according to one of claims 3 to 6 wherein said NV centers of the diamond substrate have a preferred direction (DRp) among the four possible directions.
    [0008]
    8. System according to claim 7 wherein the preferred direction (DRp) NV centers is located in a plane of the material.
    [0009]
    The system of claim 8 wherein the preferred direction (DRp) of the NV centers corresponds to the X direction.
    [0010]
    10. System according to one of the preceding claims wherein the magnetic field generator (GB) is configured so that the spatial amplitude variation of the magnetic field is monotonous along X in said part of the zone (Zo).
    [0011]
    11. System according to one of claims 3 to 10 wherein the magnetic field generator (GB) is configured so that the direction of the magnetic field is substantially aligned with a direction of NV centers. 35
    [0012]
    12. System according to one of claims 2 to 11 wherein the magnetic field generator (GB) is configured so that the direction of the magnetic field is included in a plane of the material.
    [0013]
    13. System according to one of claims 2 to 12 wherein the magnetic field generator (GB) is configured so that the direction of the magnetic field is parallel to the X direction.
    [0014]
    14. System according to one of claims 2 to 13 wherein the magnetic field generator 10 is configured so that the amplitude of the magnetic field is substantially constant in a direction Z perpendicular to a plane of the material.
    [0015]
    15. System according to one of the preceding claims further comprising an emitter antenna (EA) disposed near said material (M) and connected to a coaxial cable (C) in which circulates the microwave signal (HF) to be analyzed.
    [0016]
    16. System according to one of the preceding claims, comprising a processing device configured to acquire a plurality of images at successive instants (t1, t2 ..., tn) and to generate a two-dimensional synthetic image (ls) by juxtaposition acquired spectral images, so as to visually make an evolution of the spectrum of the microwave signal (HF) to be analyzed as a function of time. 25
    [0017]
    17. A method for analyzing a microwave signal (HF) by imaging comprising the steps of: - optically or electrically exciting a zone (Zo) of a solid material (M) at least one optical property is modifiable in said zone 30 when said zone is simultaneously in the presence of said excitation and of a microwave signal having at least one frequency coinciding with a resonant frequency (fR) of the material, said material being further adapted so that a value of the frequency of resonance (fR (B)) varies as a function of the amplitude of a magnetic field, - generating a magnetic field (B) having, within a part of said zone, a spatial amplitude variation (B (x)), said material then having a resonance frequency (fR (x)) function of a position (x) in said direction X, - receiving on a detector (D) an image (lm) of said zone (Zo ) in said direction X, said image presented at least one intensity variation ($ 51) of which a position in said image is a function of a corresponding frequency value of said microwave signal (HF) to be analyzed illuminating said material, when said part of the material zone is simultaneously excited optically or electrically and subjected to said magnetic field (B).
    [0018]
    The method of claim 17 further comprising the steps of acquiring a plurality of images at successive times (t1, t2 ..., tn) and generating a two-dimensional synthetic image (ls) by juxtaposing the acquired images, in order to visually make an evolution of the spectrum of the microwave signal (HF) to be analyzed as a function of time.
    [0019]
    19. Method according to one of claims 17 or 18 further comprising a calibration step of generating a synthetic image from a single-frequency microwave signal whose frequency varies over time according to a known law, so to obtain a correspondence between position in the image and resonance frequency.
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    同族专利:
    公开号 | 公开日
    US20170322244A1|2017-11-09|
    FR3027681B1|2016-12-09|
    EP3213093B1|2021-10-06|
    WO2016066532A1|2016-05-06|
    EP3213093A1|2017-09-06|
    US10571498B2|2020-02-25|
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    优先权:
    申请号 | 申请日 | 专利标题
    FR1402429A|FR3027681B1|2014-10-28|2014-10-28|SYSTEM FOR ANALYZING AN IMAGING HYPERFREQUENCED SIGNAL|FR1402429A| FR3027681B1|2014-10-28|2014-10-28|SYSTEM FOR ANALYZING AN IMAGING HYPERFREQUENCED SIGNAL|
    US15/522,265| US10571498B2|2014-10-28|2015-10-22|System for analysis of a microwave frequency signal by imaging|
    EP15787937.0A| EP3213093B1|2014-10-28|2015-10-22|System and method for analysis of a microwave frequency signal by imaging|
    PCT/EP2015/074544| WO2016066532A1|2014-10-28|2015-10-22|System for analysis of a microwave frequency signal by imaging|
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